Zone: Inspection/Testing/Evaluation Zone Booth No: W5-32
Highlight of the booth:
Japanese leading, fully integrated analytical services for R&D including Batteries
Product (Manufacturer)
Atomic resolution analysis using Cs-corrected STEM
Product features
We have introduced cutting-edge Cs-corrected STEM (Scanning transmission electron microprobe) whic enables atomic resolution imaging and elemental distribution for characterization of LIB active materials.
Product (Manufacturer)
Ion polishing technique in inert gas atmosphere for damage less cross section
Product features
We have developed an effective preparation technique, combining ion polishing and inert gas atmosphere, for the SEM cross-sectional imaging for active solid electrolyte materials.
Product (Manufacturer)
Binder distribution in LIB electrode using GDMS
Product features
GDMS (glow discharge mass spectroscopy) is a powerful tool to get elemental depth profile for mm size specimens. We have developed new application of GDMS for binder distribution for LIB electrode, which is important for LIB manufacturing process.
Product (Manufacturer)
Damage less cross section of battery separator using cryo-CP
Product features
We have developed a new preparation technique called cryo-CP for SEM observation for battery separators which is porous polymeric materials.
Product (Manufacturer)
Organic trace analysis in degraded electrolyte using LC/MS/MS
Product features
We have developed a new application technique for organic trace species using LC/MS/MS (Liquid Chromatography/Mass Spectroscopy/Mass Spectroscopy)
Product (Manufacturer)
In-situ analysis of positive electrode using Moessbauer and XAFS
Product features
We have been supporting customers' various needs including in-situ analysis of LIB batteries for several years. Moessbauer, XAFS, XRD and Raman are effective techniques for characterization of charged- and discharged- active materials for battery electrode.
Product category
Other Inspection/Testing/Evaluation Equipment
Other Related Apparatus/Services
Highlight of exhibit
Inert gas atmosphere pretreatment, TEM/SEM/AEM, Organic composition analysis, Infrared and Raman, solution/solid NMR, surface analysis by XPS/AES/TOF-SIMS, heat characteristic analysis, composition analysis by GC/GC-MS/NMR, synchrotron radiation (XAFS/XRD), Moessbauer method, qualitative/quantitative inorganic elemental analysis, Ion chromatography, Impurity analysis etc...
Contact information
Address: 3-1-8,Nihonbashi Muromachi,Chuo-ku,Tokyo, , 1030022, Japan
Department: Department: Tokyo Second Sales Departments
